Embedded systems can contain many different types of devices including microcontrollers, microprocessors, DSPs, RAM, EPROMs, FPGAs, A/Ds, and D/As. These various devices must communicate with each ...

Part two explains the workings of the JTAG (IEEE 1149.1) boundary-scan technology. In software development, perhaps the most critical, yet least predictable stage in the process is debugging. Many ...

Google Director of Research and renowned artificial intelligence (AI) expert Peter Norvig, presented an entirely different side of AI and machine learning at the EmTech Digital conference. He compared ...

Debug often has been labeled the curse of management and schedules. It is considered unpredictable and often can happen close to the end of the development cycle, or even after – leading to frantic ...

Scan is a structured test approach in which the overall function of an integrated circuit (IC) is broken into smaller structures and tested individually. Every state element (D flip-flop or latch) is ...

Experts at the Table: Semiconductor Engineering sat down to discuss the changes in design tools and methodologies needed for 3D-ICs, with Sooyong Kim, director and product specialist for 3D-IC at ...

April 5, 2012. Tektronix Inc. has announced the next generation of DDR3 probing solutions for logic debug and protocol validation using the Tektronix TLA7000 Series logic analyzers with support for ...

[Robert Morrison] had an ancient HP 545A logic probe, which was great for debugging SMT projects. The only problem was that being 45 years old, it wasn’t quite up to scratch when it came to debugging ...