At-speed testing and delay defect analysis have become increasingly critical in ensuring the reliability and performance of modern integrated circuits. As circuit complexity grows alongside rapid ...
SANTA CLARA, Calif. (USA) & BANGALORE, India – February 24, 2011 – SoftJin Technologies, a provider of customized automation software for Electronic Design and Manufacturing, today announced the ...
IMDEA Software researchers Facundo Molina, Juan Manuel Copia and Alessandra Gorla present FIXCHECK, a novel approach to improve patch fix analysis that combines static analysis, randomized testing and ...
The approach toward software testing has drastically changed over the years. It has changed from manual testing to automation frameworks and now to AI-based testing. It isn’t just about increasing ...
SoftJin, a provider of Customized Automation software for Electronic Design and Manufacturing, announces NxDAT, software for efficient Analysis of Defects identified by Mask Inspection Systems. The ...
A newly drafted IEEE standard will bring more consistency to defect metrics in analog/mixed (AMS) designs, a long-overdue step that has become too difficult to ignore in the costly heterogeneous ...
Automated optical inspection (AOI) is a cornerstone in semiconductor manufacturing, assembly and testing facilities, and as such, it plays a crucial role in yield management and process control.
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